Publication | Closed Access
Correlation between EOS customer return failure cases and Over Voltage Stress (OVS) test method
12
Citations
4
References
2009
Year
ReliabilityElectrical EngineeringReliability EngineeringEngineeringTest MethodSoftware TestingFailure AnalysisSystems EngineeringEngineering Failure AnalysisCircuit ReliabilityOver Voltage StressDevice ReliabilityPhysic Of Failure
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