Solid-State Electronics · 1965 · 75 citations · 4 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsCarrier TransportComplementary Metal-oxide-semiconductor TechnologyDevice ModelingSemiconductor Device MaterialsSemiconductor PhysicsSemiconductor ReliabilityForward Bias CharacteristicsJunction BreakdownP-type DopingSaturation Current
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Statistics of the Recombinations of Holes and Electrons
W. Shockley, W. T. Read · Physical Review · 1952 · 6.4K citations
F.J. Donahoe · Journal of the Franklin Institute · 1958 · 130 citations
Electron-Hole Scattering at High Injection-Levels in Germanium
L. W. Davies · Nature · 1962 · 47 citations