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Simulation study of interface traps and bulk traps in n++GaN/InAlN/AlN/GaN high electron mobility transistors

DOI

19

Citations

8

References

2014

Year

Marián Molnár, D. Donoval, J. Kuzmı́k, Juraj Marek, Aleš Chvála, Patrik Príbytný, Miroslav Mikolášek, K. Rendek, V. Palankovski
Applied Surface Science

References

YearCitations

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