Concepedia

Large excess volume in grain boundaries of stressed, nanocrystalline metallic thin films: Its effect on grain-growth kinetics

Yener Kuru, M. Wohlschlögel, U. Welzel, E. J. Mittemeijer

Applied Physics Letters · 2009 · 37 citations · 24 references

Abstract

The excess volumes per unit grain-boundary area of nanocrystalline Pd and Ni thin films were measured by an efficacious method based on real time in situ x-ray diffraction measurements. The obtained large values for the grain-boundary excess volume reveal the background of surprising, yet unexplained observations of grain growth in nanocrystalline materials.

References

24

III. Dislocation densities in some annealed and cold-worked metals from measurements on the X-ray debye-scherrer spectrum

G.K. Williamson, R.E. Smallman · Philosophical magazine · 1956 · 3.1K citations

X-ray Spectroscopy, Engineering, Severe Plastic Deformation +20

Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening

Th. H. de Keijser, J. I. Langford, E. J. Mittemeijer et al. · Journal of Applied Crystallography · 1982 · 1.2K citations

X-ray Diffraction Line, Engineering, Severe Plastic Deformation +19

Stacking fault energies and slip in nanocrystalline metals

H. Van Swygenhoven, P. M. Derlet, A. G. Frøseth · Nature Materials · 2004 · 983 citations

Engineering, Dislocation Interaction, Physics +6

Dislocation processes in the deformation of nanocrystalline aluminium by molecular-dynamics simulation

V. Yamakov, D. Wolf, Simon R. Phillpot et al. · Nature Materials · 2002 · 961 citations

Materials Science, Engineering, Severe Plastic Deformation +13

Stresses and deformation processes in thin films on substrates

M. Doerner, William D. Nix · Critical reviews in solid state and materials sciences/CRC critical reviews in solid state and materials sciences · 1988 · 598 citations

Materials Science, Engineering, Mechanical Engineering +13