Electronics Letters · 1981 · 81 citations · 1 references
Natural SciencesMaterials SciencePhysicsElectronic MaterialsOptical MaterialsSemiconductor MaterialsEpitaxial GrowthOptical Properties Of MaterialsOptical Properties Of SemiconductorsOptical Properties Of SolidsRefractive IndexThin Film Optical PropertiesEpitaxial Growth Of Wide-bandgap SemiconductorsOptical CharacterizationOptical ConstantsOptical Gain In SemiconductorsOptical Thin Film CharacterizationSimple TheoriesThin-film Optical CharacterizationThin-film Refractive Index
We have measured the refractive index versus wavelength of several compositions of GaInAsP grown by vapour phase epitaxy on InP. The self-consistent data show reasonable agreement with existing theories for wavelengths larger than the absorption edge. However, at and below the band edge, detail is measured that is not predicted by the simple theories.
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