Investigation of white etching layers on rails by optical microscopy, electron microscopy, X-ray and synchrotron X-ray diffraction - Concepedia

Concepedia

Publication | Closed Access

Investigation of white etching layers on rails by optical microscopy, electron microscopy, X-ray and synchrotron X-ray diffraction

157

Citations

10

References

2001

Year

W. Österle, H. Rooch, A. Pyzalla, L. Wang

Materials Science and Engineering A

Materials ScienceEngineeringSynchrotron X-ray DiffractionElectron MicroscopyMicrofabricationSurface ScienceApplied PhysicsPlasma EtchingOptical MicroscopySurface Processing

References

	Year	Citations

Page 1