Reduced threshold vertical-cavity surface-emittinglasers

D.B. Young, J.W. Scott, V. Malhotra, L.A. Coldren

Electronics Letters · 1994 · 21 citations · 5 references

Concepts

Abstract

Etched-pillar vertical-cavity surface-emitting laser structures have been fabricated incorporating sidewall sulphide passivation to reduce the surface recombination velocity at the exposed quantum well edges. The passivated devices exhibit a 25% reduction in surface recombination velocity and a minimum 0.67 mA threshold current.

References

5