Charge-coupled imaging devices: Experimental results

TLDR

The study describes the design and fabrication of a 96‑element 3‑phase linear charge‑coupled device. The device is built as a 96‑element 3‑phase linear CCD with configurations for improved linear and area imaging that avoid image smear during charge transfer. The device achieved ~95 % transfer efficiency over 288 transfers at 1 MHz, functioned as an analog delay line, and demonstrated the feasibility of self‑scanned imaging devices for practical applications.

Abstract

The design and fabrication of a 96-element 3-phase linear charge-coupled device are described. A transfer efficiency of ∼95 percent over 288 transfers at a 1-MHz clock rate was measured. The use of the device as an analog delay line is demonstrated and its imaging properties are illustrated with reproductions of black and white text and a picture with gray scale. The results demonstrate the feasibility of using self-scanned imaging devices in practical applications. Configurations are presented for both an improved linear and an area imaging device. In both cases the problem of image smear, which occurs if stored charge is transferred along the light-sensitive region and if significant light integration takes place during this transfer, can be avoided.