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The electron velocity-field characteristic for n-In<sub>0.53</sub>Ga<sub>0.47</sub>As at 300 K
84
Citations
4
References
1982
Year
Electrical EngineeringEngineeringPhysicsElectron SpectroscopyElectron Drift VelocitiesApplied PhysicsMicrowave Time-of-flight TechniqueAtomic PhysicsElectron OpticElectron Velocity-field CharacteristicElectron Physic
Electron drift velocities in n-type In <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0.53</inf> Ga <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0.47</inf> As have been measured at 300 K using a microwave time-of-flight technique at electric field strengths from about 10 kV/cm to 104 kV/cm. The electron velocity-field characteristic for n-type In <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0.53</inf> Ga <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0.47</inf> As exhibits a larger negative differential mobility and a lower high field velocity than is obtained with GaAs.
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