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Surface defects and Fermi‐level pinning in InP
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1982
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EngineeringMaterial InnovationVacuum DeviceStructural MaterialsMaterials FabricationQuantum MaterialsMaterial PhysicMaterials SciencePhysicsMaterial PropertyEngineering PhysicsDefect FormationSurface DefectsSurface ScienceApplied PhysicsCondensed Matter PhysicsMaterials CharacterizationFermi‐level PinningVacuum ScienceMaterial PerformanceTechnologyFunctional Materials
Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation J. D. Dow, R. E. Allen; Surface defects and Fermi‐level pinning in InP. J. Vac. Sci. Technol. 1 March 1982; 20 (3): 659–661. https://doi.org/10.1116/1.571620 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAVS: Science & Technology of Materials Interfaces and ProcessingJournal of Vacuum Science and Technology Search Advanced Search |Citation Search