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Spectroscopic ellipsometry with compensator and X-ray specular reflectivity for characterization of thin optical layers on transparent substrates

Materials ScienceOptical MaterialsEngineeringOptical PropertiesSpectroscopyOptical TestingApplied PhysicsX-ray Specular ReflectivitySpectroscopic EllipsometryThin Optical LayersOptical SpectroscopyOptical CharacterizationReflectanceOptoelectronicsSpectroscopic PropertyDepth-graded Multilayer Coating