Concepedia

Author

O. Lartigue

Commissariat à l'Énergie Atomique et aux Énergies Alternatives

Also Known As

Lartigue, O, Lartigue, O., O LARTIGUE, O Lartigue, O. Lartigue, Oliver Lartigue, Olivier Lartigue

28

Publications

153

Citations

8

H-Index

40

Concepts

All Affiliations

Commissariat à l'Énergie Atomique et aux Énergies AlternativesCEA GrenobleUniversité Grenoble AlpesLaboratoire d'Électronique des Technologies de l'InformationInstitut polytechnique de Grenoble
OL

About

O. Lartigue is an author at Commissariat à l'Énergie Atomique et aux Énergies Alternatives specializing in engineering, applied physics, and optical properties.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

6

6

94

2

Applied Physics

5

5

74

3

Materials Science

3

3

41

4

Natural Sciences

1

1

15

5

Biomedical Engineering

1

1

19

O. Lartigue

×

7

Publications

117

Citations

7

H-Index

YearCitations

Volume Fabrication of Quantum Cascade Lasers on 200 mm-CMOS pilot line

Jean-Guillaume Coutard, M. Brun, Maryse Fournier,

Scientific Reports

2020

23

Development of a Miniaturized Differential Photoacoustic Gas Sensor

J. Rouxel, Jean-Guillaume Coutard, S. Gidon,

Procedia Engineering

2015

20

Downsizing and Silicon Integration of Photoacoustic Gas Cells

Alain Glière, Pierre Barritault, A. Berthelot,

International Journal of Thermophysics

2020

19

Mid-infrared characterization of refractive indices and propagation losses in GaSb/AlXGa1−XAsSb waveguides

Sophie Roux, Pierre Barritault, O. Lartigue,

Applied Physics Letters

2015

18

Spectroscopic ellipsometric scatterometry: sources of errors in critical dimension control

J. Hazart, G. Grand, Philippe Thony,

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

2003

15

Multispectral surface plasmon resonance approach for ultra-thin silver layer characterization: Application to top-emitting OLED cathode

S. Taverne, Baptiste Caron, Stéphane Gétin,

Journal of Applied Physics

2018

12

Spectroscopic ellipsometry with compensator and X-ray specular reflectivity for characterization of thin optical layers on transparent substrates

F. Bertin, Amal Chabli, E. Chiariglione,

Thin Solid Films

1998

10

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