Ultrafast dephasing of continuum transitions in bulk semiconductors

Abstract

We have studied the coherent emission from bulk semiconductors by spectrally resolved and spectrally integrated four-wave mixing (FWM) with broadband 16-fs pulses in the carrier density range from $1\ifmmode\times\else\texttimes\fi{}{10}^{16}{\mathrm{cm}}^{\mathrm{\ensuremath{-}}3}$ to $6\ifmmode\times\else\texttimes\fi{}{10}^{17}{\mathrm{cm}}^{\mathrm{\ensuremath{-}}3}.$ In GaAs, only continuum transitions are excited, while both excitonic and continuum transitions are excited in ${\mathrm{Al}}_{0.06}{\mathrm{Ga}}_{0.94}\mathrm{As}.$ The decay of the FWM signal for positive time delays unambiguously reflects the dephasing of the continuum, irrespective of the excitation of excitonic transitions. We find identical ultrafast sub-20-fs decay times of the coherent emission from continuum transitions in GaAs and ${\mathrm{Al}}_{0.06}{\mathrm{Ga}}_{0.94}\mathrm{As},$ independent of the excess excitation energy. These decay times depend only weakly on the carrier density for densities below ${10}^{17}{\mathrm{cm}}^{\mathrm{\ensuremath{-}}3}.$ The continuum dephasing is analyzed considering carrier-carrier and carrier-LO-phonon scattering in a relaxation rate approach. The excitonic transitions in ${\mathrm{Al}}_{0.06}{\mathrm{Ga}}_{0.94}\mathrm{As}$ dominate the FWM signal at negative time delays.