Characterization of polyacrylonitrile films grafted onto nickel by ellipsometry, atomic force microscopy and X-ray reflectivity - Concepedia

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Characterization of polyacrylonitrile films grafted onto nickel by ellipsometry, atomic force microscopy and X-ray reflectivity

18

Citations

25

References

1997

Year

Cédric Calberg, M. Mertens, R. Jérôme, X. Arys, Alain M. Jonas, R. Legras

Thin Solid Films

Materials ScienceAtomic Force MicroscopyEngineeringNanomaterialsSurface ScienceApplied PhysicsPolyacrylonitrile FilmsX-ray ReflectivitySurface ModificationNanometrology

References

	Year	Citations

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