Journal of The Electrochemical Society · 2001 · 78 citations · 10 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsInterface ScienceSemiconductor MaterialsInterface EngineeringSemiconductor Device MaterialsSemiconductor InterfacesSurface PhysicsThin Film Electrical PropertiesThin-film MaterialsAnnealing EffectsCurrentsElectrical PropertiesPolycrystalline MaterialsSiliconSilicon DioxideThin Oxide FilmsThin Oxide Layers
NRC publication: Yes
10
Surface Studies of Solids by Total Reflection of X-Rays
L. G. Parratt · Physical Review · 1954 · 5.1K citations
Dielectric polarizabilities of ions in oxides and fluorides
R. D. Shannon · Journal of Applied Physics · 1993 · 2.8K citations
Fowler-Nordheim Tunneling into Thermally Grown SiO2
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