Storing Matter: A new quantitative and sensitive analytical technique based on sputtering and collection of sample material

Evaluation of a cesium positive ion source for secondary ion mass spectrometry

H. A. Storms, Kenneth F. Brown, John D. Stein · Analytical Chemistry · 1977 · 347 citations

Natural Sciences, Chemistry, Analytical Chemistry +11

Secondary ion mass spectrometry

PC Zalm · Vacuum · 1994 · 119 citations

Natural Sciences, Chemistry, Materials Science +16

Spatially multidimensional secondary ion mass spectrometry analysis

F. Rüdenauer · Analytica Chimica Acta · 1994 · 28 citations

Natural Sciences, Biochemistry, Chemistry +8

Optimization of secondary ion mass spectrometry for quantitative trace analysis

Gerhard Stingeder · Analytica Chimica Acta · 1994 · 24 citations

Natural Sciences, Chemistry, Analytical Chemistry +9

Angular distribution of GaAs sputtered under oblique Cs+ bombardment

Christophe Verdeil, Tom Wirtz, H. Scherrer · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2009 · 14 citations

Engineering, Electrical Engineering, Materials Science +11