Optimization of secondary ion mass spectrometry for quantitative trace analysis

Evaluation of a cesium positive ion source for secondary ion mass spectrometry

H. A. Storms, Kenneth F. Brown, John D. Stein · Analytical Chemistry · 1977 · 347 citations

Natural Sciences, Chemistry, Analytical Chemistry +11

A method for the quantitative measurement of rare earth elements in the ion microprobe

E. Zinner, G. Crozaz · International Journal of Mass Spectrometry and Ion Processes · 1986 · 303 citations

Natural Sciences, Chemistry, Analytical Chemistry +7

A new secondary ion mass spectrometry technique for III-V semiconductor compounds using the molecular ions CsM+

Yijie Gao · Journal of Applied Physics · 1988 · 282 citations

Natural Sciences, Chemistry, Materials Science +16

Beam-induced broadening effects in sputter depth profiling

K. Wittmaack · Vacuum · 1984 · 161 citations

Natural Sciences, Materials Science, Physics +8

Ion implantation for in-situ quantitative ion microprobe analysis

D. P. Leta, George H. Morrison · Analytical Chemistry · 1980 · 98 citations

Natural Sciences, Chemistry, Analytical Chemistry +4