XPS characterization of different thermal treatments in the ITO–Si interface of a carbonate-textured monocrystalline silicon solar cell

Probing the transition layer at the SiO2-Si interface using core level photoemission

G. Hollinger, F. J. Himpsel · Applied Physics Letters · 1984 · 442 citations

Natural Sciences, Chemistry, Materials Science +17

Structures and properties of electron-beam-evaporated indium tin oxide films as studied by x-ray photoelectron spectroscopy and work-function measurements

Takao Ishida, Hikaru Kobayashi, Yoshihiro Nakato · Journal of Applied Physics · 1993 · 258 citations

Natural Sciences, Materials Science, Physics +17

Effects of heat treatment on properties of ITO films prepared by rf magnetron sputtering

Yalan Hu, Xungang Diao, Cong Wang et al. · Vacuum · 2004 · 247 citations

Natural Sciences, Materials Engineering, Materials Science +16

X-ray photoelectron spectroscopy investigation on the chemical structure of amorphous silicon nitride (<i>a</i>-SiN<i>x</i>)

G. M. Ingo, N. Zacchetti, D. Della Sala et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1989 · 136 citations

Natural Sciences, Chemistry, Materials Science +17

Investigation of texturization for crystalline silicon solar cells with sodium carbonate solutions

Y. Nishimoto, Keisuke Namba · Solar Energy Materials and Solar Cells · 2000 · 93 citations

Natural Sciences, Materials Engineering, Materials Science +14