Concepedia

Test of annealed Czochralski grown silicon crystals as X-ray diffraction elements with 145 keV synchrotron radiation

J. R. Schneider, Hiroyuki Nagasawa, L. E. Berman, J. B. Hastings, D. P. Siddons, W. Zulehner

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1989 · 52 citations · 7 references

DOI

Concepts

References

7

TAILLESS X-RAY SINGLE-CRYSTAL REFLECTION CURVES OBTAINED BY MULTIPLE REFLECTION

U. Bonse, Michael Hart · Applied Physics Letters · 1965 · 366 citations

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Triple crystal diffractometer investigations of silicon crystals with different collimator-analyzer arrangements

P. Zaumseil, U. J. Winter · physica status solidi (a) · 1982 · 87 citations

, , +13

Annealed Czochralski grown silicon crystals: A new material for the monochromatisation of synchrotron radiation and X-rays above 60 keV

J. R. Schneider, O.D. Gonçalves, A.J. Rollason et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1988 · 51 citations

, , +16

Resolution function of an X-ray triple-crystal diffractometer

R. A. Cowley · Acta Crystallographica Section A Foundations of Crystallography · 1987 · 41 citations

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Triple Crystal Diffractometer Investigations of Imperfections in Silicon Crystals with Laue-Case Diffraction

P. Zaumseil, U. J. Winter · physica status solidi (a) · 1982 · 25 citations

, , +13