Electronics Letters · 2003 · 10 citations · 5 references
EngineeringMaterials EngineeringMaterials ScienceSemiconductor DevicesSemiconductor MaterialsThin FilmsSemiconductor Device MaterialsSemiconductor SurfacesSemiconductor Thin FilmsThin Film EtchingThin-film DepositionThin-film MaterialsAluminum Gallium NitrideAluminum NitrideAluminum Nitride DevicesGallium Nitride (Gan) MaterialsNitride Thin FilmsNitrides Thin Films
High quality AlN films have been obtained on SiO2/Si and GaN/Sapphire using the helicon sputtering method. Fabrication of the thin film layered structure surface acoustic wave (SAW) devices has been demonstrated and the promising characteristics are presented.
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Piezoelectric AlN film for SAW devices applications
Cinzia Caliendo, Giovanni Saggio, P. Verardi et al. · 1993 · 20 citations
Natural Sciences, Materials Engineering, Materials Science +17
High frequency SAW filter on diamond
K. Higaki, H. Nakahata, H. Kitabayashi et al. · 2002 · 14 citations