Surface state related noise in p-n junctions

The Si-SiO₂Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance Technique

E. H. Nicollian, A. Goetzberger · Bell System Technical Journal · 1967 · 1.8K citations

Engineering, Electrical Engineering, Materials Science +17

Characteristics of the Surface-State Charge (Qss) of Thermally Oxidized Silicon

B. E. Deal, Michael C. Sklar, Andrew S. Grove et al. · Journal of The Electrochemical Society · 1967 · 708 citations

Engineering, Materials Engineering, Materials Science +17

Semiconductor surface physics

C. Hilsum · Journal of Physics and Chemistry of Solids · 1958 · 616 citations

Fluctuation phenomena in solids

W. A. Miller · Proceedings of the IEEE · 1965 · 506 citations

Natural Sciences, Materials Science, Physics +12

The effects of oxide traps on the MOS capacitance

F.P. Heiman, G. Warfield · IEEE Transactions on Electron Devices · 1965 · 437 citations

Engineering, Electrical Engineering, Materials Science +17