Microelectronics Reliability · 2014 · 16 citations · 2 references
EngineeringMaterials EngineeringMaterials ScienceMicroelectronicsMicrofabricationSemiconductor DevicesMicrofabrication MaterialsMicrofabrication ProcessesBumps
2
The Ga-In (Gallium-Indium) System
Tim Anderson, I. Ansara · Journal of Phase Equilibria · 1991 · 166 citations
Exploring cryogenic focused ion beam milling as a Group III–V device fabrication tool
Melissa Commisso Dolph, Christopher Santeufemio · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2014 · 14 citations
Natural Sciences, Materials Engineering, Materials Science +13