Structural and morphological characterization WCxNy thin films grown by pulsed vacuum arc discharge in an argon–nitrogen atmosphere

Rogelio Ospina, J. F. Jurado, Juan Manuel Vélez, P.J. Arango, C.D. Salazar-Enríquez, E. Restrepo-Parra

Surface and Coatings Technology · 2010 · 10 citations · 45 references

Concepts

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