Concepedia

Simultaneous Rietveld refinement of three phases in the Ag-In-S semiconducting system from X-ray powder diffraction

Gerzón E. Delgado, Asiloé J. Mora, C.A. Pineda, T. Tinoco

Materials Research Bulletin · 2001 · 75 citations · 10 references

DOI

Concepts

References

10

A profile refinement method for nuclear and magnetic structures

H. M. Rietveld · Journal of Applied Crystallography · 1969 · 17.2K citations

, , +9

Quantitative phase analysis from neutron powder diffraction data using the Rietveld method

R. J. Hill, C. J. Howard · Journal of Applied Crystallography · 1987 · 1.3K citations

, , +16

Zinc-blende–wurtzite polytypism in semiconductors

Chin-Yu Yeh, Zhiwei Lü, Sverre Froyen et al. · Physical review. B, Condensed matter · 1992 · 1.1K citations

, , +17

<i>F</i><sub><i>N</i></sub>: A criterion for rating powder diffraction patterns and evaluating the reliability of powder-pattern indexing

Gordon S. Smith, Robert L. Snyder · Journal of Applied Crystallography · 1979 · 1.1K citations

, , +16

A simplified criterion for the reliability of a powder pattern indexing

Paweł Wolff · Journal of Applied Crystallography · 1968 · 889 citations

, , +13