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Fourier transform IR monitoring of porous silicon passivation during post-treatments such as anodic oxidation and contact with organic solvents

Advanced Oxidation ProcessChemical EngineeringPorous Silicon PassivationEngineeringOrganic SolventsMicrofabricationSurface ScienceWater TreatmentChemistryAnodic OxidationPhotodegradationChemical KineticsSilicon On InsulatorSilicon Debugging