AES sputtering depth profile analysis of C/W layered synthetic microstructures

Chemical Effects in Auger Electron Spectroscopy

T. W. Haas, John T. Grant, George J. Dooley · Journal of Applied Physics · 1972 · 288 citations

Natural Sciences, Chemistry, Materials Science +13

Metallic multilayers for x rays using classical thin-film theory

B. Vidal, P. Vincent · Applied Optics · 1984 · 260 citations

Natural Sciences, Materials Science, Physics +17

Low-Loss Reflection Coatings Using Absorbing Materials

Eberhard Spiller · Applied Physics Letters · 1972 · 176 citations

Natural Sciences, Materials Engineering, Materials Science +14

Depth resolution in sputter profiling

S. Hofmann · Applied Physics A · 1977 · 94 citations

Computing, Computer Science, Metrology +7

Auger electron spectroscopy depth profiling of Ni/Cr multilayers by sputtering with N2+ ions

S. Hofmann, A. Zalar · Thin Solid Films · 1979 · 73 citations

Natural Sciences, Materials Engineering, Materials Science +11