Publication | Closed Access
Auger electron spectroscopy depth profiling of Ni/Cr multilayers by sputtering with N2+ ions
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Citations
27
References
1979
Year
Materials ScienceSurface CharacterizationEngineeringSpectroscopy Depth ProfilingPhysicsElectron SpectroscopyNatural SciencesSpectroscopySurface ScienceApplied PhysicsN2+ IonsSurface AnalysisNi/cr MultilayersMicroanalysisVacuum Device
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