Journal of Physics D Applied Physics · 2010 · 10 citations · 15 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsOptical MaterialsSemiconductor MaterialsAbsorption SpectroscopyDefects In Electronic MaterialsOptical SpectroscopySemiconductor DefectsSolar CellsAbsorber MaterialsCarrier RecombinationCharge Carrier RecombinationDeep-level DefectsLateral ResolutionLight-absorbing LayersPhotoluminescenceQuasi-fermi Levels
Abstract\nAnalogously with Cu(In, Ga)Se 2, CuInS 2 shows a high degree of spatial inhomogeneities in structural, optical and electronic properties on the length scale of grain sizes and above which is caused by the grainy structure and the inhomogeneous growth of absorber layers. To analyze these locally fluctuating magnitudes, spectrally resolved photoluminescence measurements with high lateral resolution (? 1?m) have been performed in a confocal microscope set-up. Based on these data sets and on Planck's generalized law the determination of the spatial variation in the splitting of the quasi-Fermi levels and access to the local absorbance is possible. A detailed analysis of these properties, crucial for the solar light conversion efficiency of a final cell, is made for a CuInS 2 absorber layer for data obtained from statistically representative scan areas. A cross-correlation between the splitting of the local quasi Fermi levels and the local absorbance of an absorber leads to the conclusion that the splitting of quasi Fermi levels is strongly governed by the excess-carrier recombination via deep defects.
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