Concepedia

X-ray diffraction analysis of the anisotropic nature of the structural imperfections in a sputter-deposited TiO2/Ti3Al bilayer

Yonghao Zhao, U. Welzel, J. van Lier, E. J. Mittemeijer

Thin Solid Films · 2006 · 11 citations · 33 references

DOI

Concepts

References

33

<i>International Tables for X-ray Crystallography</i>

Acta Crystallographica Section B · 1976 · 14.2K citations · Full text

, , +11

Stress-related effects in thin films

John A. Thornton, David W. Hoffman · Thin Solid Films · 1989 · 1.1K citations

, , +14

<i>Theory of X-Ray and Thermal Neutron Scattering by Real Crystals</i>

M. A. Krivoglaz, Leonid V. Azároff · Physics Today · 1970 · 723 citations

, , +11

Intrinsic stress in sputter-deposited thin films

H. Windischmann · Critical reviews in solid state and materials sciences/CRC critical reviews in solid state and materials sciences · 1992 · 644 citations

, , +14

A rapid method for analysing the breadths of diffraction and spectral lines using the Voigt function

J. I. Langford · Journal of Applied Crystallography · 1978 · 621 citations

, , +17