Concepedia

A new look at yield of integrated circuits

Proceedings of the IEEE · 1970 · 104 citations · 3 references

Concepts

EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesStochastic ModelingDevice ModelingDevice ReliabilityIntegrated Circuit DesignIntegrated Circuit DevicesSemiconductor ReliabilityYield AnalysisHardware Fault Models

Abstract

Expressions are derived for integrated-circuit yield as a function of active circuit area, using as a model random distributions of indistinguishable spot defects. Previous attempts to calculate integrated-circuit yield have used a nonrandom distribution of distinguishable spot defects as their model.

References

3

Cost-size optima of monolithic integrated circuits

B.T. Murphy · Proceedings of the IEEE · 1964 · 389 citations

Engineering, Computer Engineering, Electrical Engineering +17

Yield and cost analysis of bipolar LSI

R.B. Seeds · IEEE Transactions on Electron Devices · 1968 · 76 citations

Engineering, Computer Engineering, Electrical Engineering +10

Computation of integrated-circuit yields from the distribution of slice yields for the individual devices

W.G. Ansley · IEEE Transactions on Electron Devices · 1968 · 34 citations

Engineering, Electrical Engineering, Circuit Theory +7