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5 kV multielectron beam lithography: MAPPER tool and resist process characterization
27
Citations
13
References
2010
Year
Electrical EngineeringWafer Scale ProcessingEngineeringElectron-beam LithographyBeam LithographyMicrofabricationApplied PhysicsResist Process CharacterizationMapper LithographyMultielectron Beam ToolMapper ToolLow Voltage LithographySemiconductor Device FabricationElectronic PackagingInstrumentationMicroelectronicsNanolithography Method
A multielectron beam tool from MAPPER lithography was installed in LETI premises in July 2009. It is based on low voltage lithography. In order to prepare acceptance tests, a preliminary study was carried out with a Leica VB6 HR at 5 kV in order to define 5 kV suitable resist processes. Results obtained at higher voltages are compared, since this tool has the capability to accelerate electrons up to 50 kV. The dependence of the deposition of backscattered energy on voltage is also evaluated. The 5 kV results are compared with those obtained on the MAPPER tool. Its spot size is measured, while a 32 nm half pitch resolution is reached.
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