Determination of electron effective mass and electron affinity in HfO2 using MOS and MOSFET structures

Current transport in metal/hafnium oxide/silicon structure

Weihang Zhu, Tso‐Ping Ma, T. Tamagawa et al. · IEEE Electron Device Letters · 2002 · 289 citations

Electrical Engineering, Conduction Band, Energy Band Diagrams +14

Modeling and simulation of tunneling through ultra-thin gate dielectrics

Andreas Schenk, Gernot Heiser · Journal of Applied Physics · 1997 · 232 citations · Full text

Device Modeling, Semiconductors, Electrical Engineering +13

Interface characterization and carrier transportation in metal/HfO2/silicon structure

Fu‐Chien Chiu · Journal of Applied Physics · 2006 · 104 citations

Engineering, Silicon On Insulator, Hfo2 Dielectrics +16

Electrical, structural, and chemical properties of HfO2 films formed by electron beam evaporation

K. Cherkaoui, Scott Monaghan, Muhammad Adi Negara et al. · Journal of Applied Physics · 2008 · 61 citations · Full text

Engineering, Vacuum Device, Silicon On Insulator +19

Modeling of tunneling currents through HfO₂ and (HfO₂)_x(Al₂O₃)/sub 1-x/ gate stacks

Yunfei Hou, M.F. Li, H.Y. Yu et al. · IEEE Electron Device Letters · 2003 · 55 citations

Device Modeling, Electrical Engineering, Semiconductor Device +13