Publication | Closed Access
Electromigration in copper damascene interconnects: reservoir effects and failure analysis
30
Citations
11
References
2004
Year
Materials ScienceElectrical EngineeringElectromigration TechniqueEngineeringInterconnect (Integrated Circuits)Applied PhysicsFailure AnalysisElectronic PackagingMicroelectronicsElectrochemical InterfaceElectrochemistry
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