Process-parameter optimization of Sb2O3 films in the ultraviolet and visible region for interferometric applications

Introduction to Solid State Physics

C. Kittel, Heng Fan · American Journal of Physics · 1957 · 22.4K citations

Engineering, Physics, Solid State Physics +6

Introduction to Solid State Physics

C. Kittel, D. L. Dexter · American Journal of Physics · 1953 · 13.3K citations

Engineering, Physics, Solid State Physics +6

A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film

J.-C. Manifacier, J. Gasiot, J.P. Fillard · Journal of Physics E Scientific Instruments · 1976 · 1.7K citations

Relation Between Surface Roughness and Specular Reflectance at Normal Incidence

H. E. Bennett, J. O. Porteus · Journal of the Optical Society of America · 1961 · 1.1K citations

Optical Materials, Engineering, Surface Reflectance +15

Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films

R. Swanepoel · Journal of Physics E Scientific Instruments · 1984 · 715 citations

Optical Materials, Engineering, Optical Testing +17