Applied Physics Letters · 1985 · 48 citations · 7 references
EngineeringMaterials SciencePhysicsCondensed Matter PhysicsSemiconductor MaterialsSolid State PhysicsOptical Properties Of SemiconductorsSemiconductor Crystal GrowthSemiconductor InterfacesSemiconductor PhysicsSemiconductor SurfacesTransmission Electron MicroscopyEpitaxial Film GrowthEpitaxial Thin-film GrowthOptical PropertiesReflection High-energy Electron DiffractionSemiconductor CrystallographySemiconductor NanostructuresSuperlattice GrowthTransmission Electron Diffraction
This letter reports the first growth of (100) CdTe-CdMnTe superlattices. In the past (111) superlattices of CdTe-CdMnTe were grown on (100) GaAs substrates. To consistently achieve the desired (100) epitaxy, three different growth techniques are described. Reflection high-energy electron diffraction is used to observe the initial nucleation of the (100) CdTe film, while transmission electron microscopy is used to investigate the nature of the interface between the epitaxial film and the substrate. The optical properties of these superlattices show interesting differences with the (111) superlattices.
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Molecular beam epitaxy of Cd1−<i>x</i>Mn<i>x</i>Te
L. A. Kolodziejski, T. SAKAMOTO, R. L. Gunshor et al. · Applied Physics Letters · 1984 · 94 citations
Natural Sciences, Materials Engineering, Materials Science +17
Properties of Cd1−<i>x</i>Mn<i>x</i>Te–CdTe superlattices grown by molecular beam epitaxy
R. N. Bicknell, N. C. Giles‐Taylor, D. K. Blanks et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1985 · 46 citations
Natural Sciences, Materials Engineering, Materials Science +16