Solid-State Electronics · 1975 · 41 citations · 26 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesAvalanche ProcessesDevice CharacterizationDevice ModelingIntegrated Circuit DevicesMetal-oxide-semiconductor Field-effect TransistorsOxide SemiconductorsAvalanche BreakdownAvalanche EffectAvalanche GainGate Oxide InterfacesGate Oxides
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Physics of Semiconductor Devices
Geoffrey Pridham · Electronics and Power · 1970 · 4K citations
Choice Reviews Online · 1995 · 1.7K citations
Problems related to p-n junctions in silicon
W. Shockley · Solid-State Electronics · 1961 · 917 citations
Ionization Rates for Electrons and Holes in Silicon
A. G. Chynoweth · Physical Review · 1958 · 580 citations
Ionization Rates of Holes and Electrons in Silicon
C. A. Lee, R. A. Logan, R. L. Batdorf et al. · Physical Review · 1964 · 475 citations