Optically detected cyclotron resonance properties of high purity ZnSe epitaxial layers grown on GaAs

M. Drechsler, B. K. Meyer, D.M. Hofmann, P. Ruppert, D. Hommel

Applied Physics Letters · 1997 · 26 citations · 8 references

Concepts

Abstract

The conduction band electron properties in ZnSe epitaxial layers on GaAs grown by molecular beam epitaxy are determined by far-infrared optically detected cyclotron resonance experiments. The high ωτ-value (in excess of 800) allows the observation of the spin splitting of the cyclotron resonance. The splitting is 8 mT in agreement with theoretical predictions.

References

8