Characterisation of ZnS:Mn thin films by Rietveld refinement of Bragg–Brentano X-ray diffraction patterns

A profile refinement method for nuclear and magnetic structures

H. M. Rietveld · Journal of Applied Crystallography · 1969 · 17.2K citations

Natural Sciences, Physics, Crystal Structure +9

X-ray diffraction procedures

Harold P. Klug, Leroy Alexander · CERN Document Server (European Organization for Nuclear Research) · 1954 · 4.2K citations

Correction of intensities for preferred orientation in powder diffractometry: application of the March model

W. A. Dollase · Journal of Applied Crystallography · 1986 · 1.7K citations

Natural Sciences, Materials Engineering, Materials Science +17

Quantitative phase analysis from neutron powder diffraction data using the Rietveld method

R. J. Hill, C. J. Howard · Journal of Applied Crystallography · 1987 · 1.3K citations

Natural Sciences, Chemistry, Materials Science +16

Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening

Th. H. de Keijser, J. I. Langford, E. J. Mittemeijer et al. · Journal of Applied Crystallography · 1982 · 1.2K citations

Natural Sciences, Materials Engineering, Materials Science +16