Journal of Applied Physics · 2006 · 67 citations · 35 references
EngineeringAfm TipMicroscopySoft MatterNanotribologyAtomic Force MicroscopeCapillarity PhenomenonAdhesion ExperimentsNanomechanicsBiophysicsNanotechnologySurface TensionNanofluidicsNanomaterialsMicrofabricationSurface ScienceApplied PhysicsScanning Force MicroscopyMedicineCapillary Forces
The capillary force between two fine particles or between the tip of an atomic force microscope (AFM) and a surface depends on the precise geometry of the contact region. In this paper we demonstrate that vice versa from a measurement of the adhesion force versus humidity one can calculate the shape of the AFM tip (or the geometry of the contact between particles). This is verified by adhesion experiments with an AFM.
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Calibration of atomic-force microscope tips
Jeffrey L. Hutter, John Bechhoefer · Review of Scientific Instruments · 1993 · 4.1K citations
Engineering, Afm Tip, Microscopy +17
Calculation of thermal noise in atomic force microscopy
Hans‐Jürgen Butt, Manfred Jaschke · Nanotechnology · 1995 · 1.6K citations