Publication | Closed Access
Defects, stress and abnormal shift of the (002) diffraction peak for Li-doped ZnO films
76
Citations
33
References
2010
Year
Materials ScienceDiffraction PeakIi-vi SemiconductorMaterial AnalysisEngineeringAbnormal ShiftOxide ElectronicsApplied PhysicsCondensed Matter PhysicsGallium OxideDefect FormationLi-doped Zno FilmsThin Films
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