Measurement of 'material' parameters in multi-quantum-well structures

John Orton, Paul F. Fewster, J. P. Gowers, P. Dawson, K. J. Moore, Peter J. Dobson, C. J. Curling, C. T. Foxon, K. Woodbridge, G. Duggan,

Semiconductor Science and Technology · 1987 · 32 citations · 23 references

Concepts

Abstract

Multi-quantum-well (MQW) structures can be regarded as new materials whose properties are determined by the well and barrier thicknesses Lz and LB and the well depth (which is composition dependent). Measurements of Lz, LB and x are reported for 16 MQW samples grown by molecular beam epitaxy in the AlxGa1-xAs system. Results from X-ray diffraction, photoluminescence excitation spectroscopy and transmission electron microscopy are found to compare well with each other and with values predicted from MBE growth conditions.

References

23