C. J. Curling

Composition and lattice-mismatch measurement of thin semiconductor layers by x-ray diffraction

Paul F. Fewster, C. J. Curling · Journal of Applied Physics · 1987 · 206 citations

Diffraction Peaks, Engineering, X-ray Diffraction Methods +18

A scalable manufacturing process for flexible active‐matrix e‐paper displays

S. E. Burns, Kevin Reynolds, William Reeves et al. · Journal of the Society for Information Display · 2005 · 53 citations

7.4: A Flexible Plastic SVGA e‐Paper Display

S. E. Burns, William Reeves, Boon Hean Pui et al. · SID Symposium Digest of Technical Papers · 2006 · 33 citations

Measurement of 'material' parameters in multi-quantum-well structures

John Orton, Paul F. Fewster, J. P. Gowers et al. · Semiconductor Science and Technology · 1987 · 32 citations

Materials Science, Quantum Science, Mqw Samples +13

2D Image Sensing Arrays with NIP Diodes

C. van Berkel, N.C. Bird, C. J. Curling et al. · MRS Proceedings · 1993 · 20 citations

Electrical Engineering, Photoelectric Sensor, Engineering +6