Physical Review Letters · 1983 · 292 citations · 4 references
Natural SciencesMaterials ScienceOptical MaterialsOpticsSurface ScienceX-ray OpticsX-ray SpectroscopyEvanescent WavesMicroscopic ReversibilityReversibilityX-ray Absorption DetectionX-ray Reflectivity
The presence and properties of x-ray evanescent waves are demonstrated detecting their absorption and their excitation in the vicinity of a target surface. The role of microscopic reversibility in relating the two cases is discussed and practical applications of the phenomena to probe interfaces are suggested.
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