Physical Review Letters · 1981 · 338 citations · 9 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsMaterials CharacterizationSurface ScienceDiffractionSurface CharacterizationSurface CrystallographySurface PhysicsX-ray CrystallographyX-ray DiffractionSubsurface ReflectionX-ray Diffraction AnalysisX-ray Diffraction Strain AnalysisX-ray Structure Determination
Standard x-ray diffraction in which a reflection goemetry is used is shown to have a simple interpretation and adequate sensitivity for determining the structure of monolayers. It has been utilized to verify that subsurface strain occurs in Ge(001)-(2\ifmmode\times\else\texttimes\fi{}1) reconstruction.
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Atomic and Electronic Structures of Reconstructed Si(100) Surfaces
D. J. Chadi · Physical Review Letters · 1979 · 1.1K citations