Publication | Closed Access
Preparation of H-terminated Si surfaces and their characterisation by measuring the surface state density
40
Citations
13
References
1996
Year
Materials ScienceSurface CharacterizationEngineeringNanoelectronicsSurface AnalysisSurface ScienceApplied PhysicsSemiconductor Device FabricationSurface State DensityH-terminated Si SurfacesSilicon On Insulator
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