Graded X-ray Optics for Synchrotron Radiation Applications

Abstract

Using X-ray diffractometry and spectral measurements, the structure and properties of graded X-ray optical elements have been examined. Experimental and theoretical data on X-ray supermirrors, which were prepared by the magnetron sputtering technique using precise thickness control, are reported. Measurements on graded aperiodic Si(1-x)Ge(x) single crystals, which were grown by the Czochralski technique, are also presented. The lattice parameter of such a crystal changes almost linearly with increasing Ge concentration. The measurements indicate that Si(1-x)Ge(x) crystals with concentrations up to 7 at.% Ge can be grown with a quality comparable to that of pure Si crystals.