Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material

Abstract

A conductive distributed Bragg reflector (DBR) composed entirely of a single material—indium tin oxide (ITO)—is reported. The high- and low-refractive-index layers of the DBR are deposited by oblique-angle deposition and consist of ITO thin films with low and high porosities, which yield an index contrast of Δn=0.4. A single-material DBR with three periods achieves a reflectivity of 72.7%, in excellent agreement with theory.