Determination of the source of two extra components in Si 2p photoelectron spectra of the SiO2/Si(1 0 0 ) interface

Diffraction and holography with photoelectrons and Auger electrons: some new directions

C. S. Fadley · Surface Science Reports · 1993 · 154 citations

Holography, Engineering, Electron-beam Lithography +12

Chemical Structures of the SiO₂Si Interface

Takeo Hattori · Critical reviews in solid state and materials sciences/CRC critical reviews in solid state and materials sciences · 1995 · 118 citations

Materials Science, Flat Silicon Surface, Chemical Structures +13

Structurally relaxed models of the Si(001)–SiO2 interface

Alfredo Pasquarello, Mark S. Hybertsen, Roberto Car · Applied Physics Letters · 1996 · 112 citations · Full text

Semiconductors, Materials Science, Engineering +12

High-resolution core-level study of initial oxygen adsorption on Si(001): Surface stoichiometry and anomalous Si<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mn>2</mml:mn><mml:mi>p</mml:mi></mml:math>core-level shifts

Han Woong Yeom, H. Hamamatsu, T. Ohta et al. · Physical review. B, Condensed matter · 1999 · 51 citations

Semiconductors, Submonolayer Adsorption, Surface Characterization +15

MSPHD: A full multiple scattering code for low energy photoelectron diffraction

R. Gunnella, F. Solal, D. Sébilleau et al. · Computer Physics Communications · 2000 · 35 citations

Photonics, Engineering, Physics +7