Applied Physics Letters · 2005 · 32 citations · 14 references
Natural SciencesMaterials EngineeringMaterials ScienceCrystal StructureElectronic MaterialsMaterials ChemistryImplant MaterialsIon ImplantationMetal OxidesNitrogen OxidesOxide SemiconductorsAnnealingAnnealing Temperature EffectsImplantation-induced Defect FormationPositron Annihilation SpectroscopyPost-implantation AnnealingVacancy ClustersVacancy ComplexesZinc Oxides
ZnO crystals were implanted with N+, O+, and Al+, and co-implanted with O+∕N+ and Al+∕N+ ions. Positron annihilation measurements indicate introduction of vacancy clusters upon implantation. In the N+-implanted and Al+∕N+ co-implanted samples, these vacancy clusters are only partially annealed at 800°C, as compared with their entire recovery in the O+- and Al+-implanted samples at 800–900°C, suggesting a strong interaction between nitrogen and vacancy clusters. However, in the O+∕N+ co-implanted sample, most vacancy clusters disappear at 800°C. Probably oxygen scavenges nitrogen to enhance the annealing of the vacancy clusters. Upon further annealing at 1000–1100°C, nitrogen also forms stable complexes with thermally generated vacancies. These nitrogen-related vacancy complexes need high-temperature annealing at 1200–1250°C to be fully removed.
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Filip Tuomisto, V. Ranki, K. Saarinen et al. · Physical Review Letters · 2003 · 460 citations · Full text
Compensation mechanism for N acceptors in ZnO
Eun‐Cheol Lee, Y.-S. Kim, Young-Gu Jin et al. · Physical review. B, Condensed matter · 2001 · 385 citations