33rd Joint Propulsion Conference and Exhibit · 1997 · 18 citations · 3 references
EngineeringElectrical EngineeringPhysicsElectrochemistryPlasma PhysicsSemiconductor DevicesCathode MaterialsCurrent-voltage CharacteristicsDevice CharacterizationDevice ModelingDevice SimulationPlasma SimulationCharge TransportCharge Transport MechanismsCharge Transport ModelingHollow Cathode DischargesHollow CathodesMass Flow RatePhenomenological ModelsWork Function
A simple phenomenological model describing the discharge in the cathode-keeper region oforificed Hollow Cathode devices with low work function insert has been developed on the basis of both previous models and other simple analytical relations summarizing charge transport in the orifice region and in the cathode tipkeeper region. The model is able to qualitatively describe trends of plasma parameters varying operating condition of the devices (discharge current and mass flow rate) and to simulate discharge parameters (discharge voltage and cathode temperature) with good correspondance with experimental data. This model seems a promising tool for preliminary design check and optimization in view of its ability to estimate cathode temperature and discharge voltage for different geometries and device operating condition
3